Description: ISO/TR 18394:2006 provides guidelines for identifying chemical effects in X-ray or electron-excited Auger-electron spectra and for using these effects in chemical characterization.

(Image: A. Carlson, Wikimedia Commons, in the public domain) Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS) are both essential for analyzing material surfaces, offering ...

The PHI 5800 X-ray photoelectron spectrometer (XPS) is equipped with a dual source anode (Al and Mg), a hemispherical analyzer for XPS and Auger electron spectroscopy (AES) analysis, including ...

Auger spectra secondary electron images of surfaces elemental line scans and maps and depth profiles. The depth distribution of components at and near the surface can be evaluated by using AES in ...

In a recent article, researchers analyzed electron-cloud alignment in atomic argon induced by intense XFEL pulses. The study ...